DocumentCode :
1175519
Title :
Statistical analysis for practical circuit design
Author :
Balaban, Philip ; Golembeski, John J.
Volume :
22
Issue :
2
fYear :
1975
fDate :
2/1/1975 12:00:00 AM
Firstpage :
100
Lastpage :
108
Abstract :
Statistical analysis using the Monte Carlo method is shown to have significant value in the design of practical circuits. Three integrated circuit examples are described; a logic circuit with critical dc properties, a gate with stringent transient requirements, and a hybrid circuit which combines precise linear high-frequency and transient performance. Characterization and modeling problems are described in detail. A particular device family is described by deriving statistics for the parameters of a single nonlinear model, which is then used directly for dc and transient cases and can be linearized for ac applications. Parasitic elements are included for fast high-frequency applications. Complex performance criteria are derived in a post-processor in order that the results be expressed by figures of merit which are practically meaningful, such as noise immunity of a logic gate and operating margin of a digital repeater.
Keywords :
Bipolar integrated circuits, digital; Computer applications, circuit design; Computer-aided circuit analysis and design; Monte Carlo methods; Nonlinear networks; Semiconductor logic circuits; Circuit noise; Circuit synthesis; Logic circuits; Logic gates; Mathematics; Monte Carlo methods; Repeaters; Semiconductor device noise; Statistical analysis; Statistics;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1975.1084010
Filename :
1084010
Link To Document :
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