DocumentCode :
11757
Title :
Worst Case Noise Prediction With Nonzero Current Transition Times for Power Grid Planning
Author :
Xiang Hu ; Peng Du ; Shih-Hung Weng ; Chung-kuan Cheng
Author_Institution :
Broadcom Corp., San Diego, CA, USA
Volume :
22
Issue :
3
fYear :
2014
fDate :
Mar-14
Firstpage :
607
Lastpage :
620
Abstract :
In this paper, we propose a novel method for power distribution network verification at early design stages. This approach predicts the worst case noise of on-chip power grids with multiple current sources subjected to a set of hierarchical constraints. The current constraints not only define bounds for current magnitudes, but also consider nonzero current transition times that makes the prediction of worst case noise more realistic. Under the novel current constraints, a dynamic programming algorithm is introduced to generate the worst case current sources based on the impulse responses of the power grid. The algorithm is accelerated by a modified Knuth-Yao quadrangle inequality speedup method, which reduces the time complexity from O(s2m) to O(smlogs), where s is the number of discretized current values and m is the total number of zero-crossing points of the current sources. Experimental results show that our approach not only efficiently predicts realistic worst case noise of on-chip power grids, but also correlates the frequency-domain resonance effects with the time-domain noise behavior.
Keywords :
constant current sources; dynamic programming; integrated circuit noise; printed circuit interconnections; current constraints; dynamic programming algorithm; early design stages; frequency-domain resonance effects; hierarchical constraints; impulse responses; modified Knuth-Yao quadrangle inequality speedup method; multiple current sources; nonzero current transition times; on-chip power grids; power distribution network verification; time-domain noise behavior; worst case current sources; worst case noise; zero-crossing points; Current transition time; multiple current sources; power grid verification; power integrity; worst case noise;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2013.2252210
Filename :
6495483
Link To Document :
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