• DocumentCode
    1175841
  • Title

    Dynamic behavior of high-pressure arcs near the flow stagnation point

  • Author

    Zhang, Jian Fu ; Fang, M.T.C.

  • Author_Institution
    Dept. of Electr. Eng. & Electron., Liverpool Univ., UK
  • Volume
    17
  • Issue
    3
  • fYear
    1989
  • fDate
    6/1/1989 12:00:00 AM
  • Firstpage
    524
  • Lastpage
    533
  • Abstract
    The conservation equations of high-pressure arc near the flow stagnation point have been solved for a current ramp before current zero (di/dt), and for an electrical field ramp (dE/dt) after current zero. The analysis is based on laminar flow and local thermal equilibrium. Two arc-quenching gases, sulphur-hexafluoride (SF6) and nitrogen (N2), have been investigated. The relative importance of radiation, convection, and thermal conduction under a wide range of discharge conditions is discussed. Before current zero the computed temperature of the nitrogen arc is in fair agreement with the experimental results. The predicted dependence of the critical rate of rise of the recovery electric field on di/dt and pressure is much weaker than the empirical relationship, which remains unexplained. The theory also fails to confirm the superior arc-quenching capability of SF6 over N2
  • Keywords
    arcs (electric); convection; electric fields; heat radiation; high-pressure phenomena and effects; laminar flow; thermal conductivity; N2; SF6; arc-quenching capability; arc-quenching gases; computed temperature; conservation equations; convection; critical rate; current ramp; current zero; discharge conditions; electrical field ramp; flow stagnation point; high-pressure arcs; laminar flow; local thermal equilibrium; pressure; radiation; recovery electric field; thermal conduction; Accuracy; Circuit breakers; Differential equations; Gases; Helium; Integral equations; Nitrogen; Sulfur hexafluoride; Temperature; Thermal conductivity;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.32266
  • Filename
    32266