Title :
Improved Radar System Reliability by Performance Tolerance Analysis
Author :
Sellers, William H.
Author_Institution :
Raytheon Company, Bedford, Massachusetts
fDate :
7/1/1966 12:00:00 AM
Keywords :
Circuits; Degradation; Electric breakdown; Failure analysis; Life estimation; Performance analysis; Radar; Reliability engineering; Stacking; Tolerance analysis;
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
DOI :
10.1109/TAES.1966.4501844