DocumentCode
1176237
Title
Analysis of capacitance measurements on silicon microstrip detectors
Author
Barberis, E. ; Cartiglia, N. ; Dann, J. ; Dubbs, T. ; Noble, K. ; O´Shaughnessy, K. ; Rahn, J. ; Sadrozinski, H.F.-W. ; Wichmann, R. ; Ohsugi, T. ; Unno, Y. ; Miyata, H. ; Tamura, N. ; Yamamoto, K.
Author_Institution
Inst. for Particle Phys., California Univ., Santa Cruz, CA, USA
Volume
41
Issue
4
fYear
1994
fDate
8/1/1994 12:00:00 AM
Firstpage
785
Lastpage
790
Abstract
We present an analysis of the total strip capacitance of double-sided, AC-coupled silicon microstrip detectors. We evaluate the radiation hardness and the noise contribution of different strip geometries. We comment on a serious failure mode
Keywords
capacitance; capacitance measurement; gamma-ray effects; position sensitive particle detectors; proton effects; semiconductor counters; semiconductor device noise; AC-coupled; Si; Si microstrip detectors; capacitance measurement; double-sided; failure; noise; radiation hardness; total strip capacitance; Capacitance measurement; Detectors; Frequency; Microstrip; Protons; Silicon; Solid modeling; Strips; Testing; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.322807
Filename
322807
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