DocumentCode :
1176270
Title :
Better reliability with new m.o.s. process
Volume :
16
Issue :
2
fYear :
1970
fDate :
2/1/1970 12:00:00 AM
Firstpage :
54
Abstract :
A new process for the production of integrated circuits is expected to lead to better device yields and improved reliability of finished devices, particularly for m.o.s. components.
fLanguage :
English
Journal_Title :
Electronics and Power
Publisher :
iet
ISSN :
0013-5127
Type :
jour
DOI :
10.1049/ep.1970.0047
Filename :
5179293
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1176270
