Title :
Radiation damage to tetramethlysilane and tetramethlygermanium ionization chambers
Author :
Hoshi, Y. ; Higuchi, M. ; Oyama, K. ; Akaishi, H. ; Yuta, H. ; Abe, K. ; Hasegawa, K. ; Suekane, F. ; Nagamine, T. ; Kawamura, N. ; Neichi, K. ; Katayama, J. ; Nakajima, T. ; Masuda, K. ; Kikuchi, R. ; Miyano, K.
Author_Institution :
Dept. of Appl. Phys., Tohoku Gakuin Univ., Tagajo, Japan
fDate :
8/1/1994 12:00:00 AM
Abstract :
Two detector media suitable for a warm liquid ionization chamber filled with tetramethylsilane (TMS) and tetramethylgermanium (TMG) were exposed to γ-radiation from a 60Co source up to a dose of 579 Gray and 902 Gray, respectively. The electron lifetimes and the free ion yields were measured as a function of accumulated radiation dose. A similar behavior of the electron lifetimes and the free ion yields with increasing radiation dose was observed between the TMS and TMG ionization chambers
Keywords :
gamma-ray effects; ionisation chambers; γ irradiation; 579 Gy; 902 Gy; TMG ionization chamber; TMS ionization chamber; electron lifetimes; free ion yields; radiation damage; radiation dose; Cathodes; Charge measurement; Current measurement; Electron mobility; Energy measurement; Ionization chambers; Ionizing radiation; Physics; Purification; Steel;
Journal_Title :
Nuclear Science, IEEE Transactions on
