Title :
Linewidth measurements of MEMS-based tunable lasers for phase-locking applications
Author :
Ip, Ezra ; Kahn, Joseph M. ; Anthon, Doug ; Hutchins, Jeff
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Abstract :
We have used two techniques - the beat spectrum method and the frequency noise spectrum method - to measure linewidths of microelectromechanical systems (MEMS)-based tunable external cavity lasers (ECLs) in the C-band (1527-1567 nm). The two techniques yield similar results, but the latter is able to measure narrow linewidths more accurately in the presence of frequency jitter. The MEMS-based ECL linewidths are found to be inversely proportional to output powers over a wide range of powers. At output powers of 12 dBm, the beat linewidth is no more than 30 kHz, corresponding to per-laser linewidths of about 15 kHz. We show that these lasers are suitable for coherent detection of quadrature phase-shift keying.
Keywords :
jitter; laser cavity resonators; laser mode locking; laser noise; laser tuning; laser variables measurement; micro-optics; micromechanical devices; optical communication equipment; quadrature phase shift keying; spectral line narrowing; 15 kHz; 1527 to 1567 nm; C-band; MEMS; beat spectrum method; coherent detection; external cavity lasers; frequency jitter; frequency noise spectrum method; linewidth measurements; narrow linewidths; phase-locking applications; quadrature phase-shift keying; spectral linewidths; tunable lasers; Frequency measurement; Jitter; Laser applications; Laser noise; Microelectromechanical systems; Noise measurement; Phase detection; Phase measurement; Power generation; Tunable circuits and devices; Frequency stability; laser measurement; laser tuning; microelectromechanical devices; phase jitter; phase noise; phase-locked loops; synchronous detection;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2005.856435
