DocumentCode :
1176517
Title :
Error Probability Estimation Using Bivariate Extreme-Value Theory
Author :
Ashlock, John C. ; Posner, Edward C.
Author_Institution :
Development Engineer Spacecraft Telemetry and Command Section, Jet Propulsion Laboratory, 4800 Oak Grove Drive Pasadena, California 91103
Issue :
4
fYear :
1966
fDate :
7/1/1966 12:00:00 AM
Firstpage :
463
Lastpage :
468
Abstract :
Information is ultimately conveyed by the use of some form of decision or threshold device in binary communication systems. Threshold receivers are all basically ??signal present?? receivers, and are used in both telemetry and command systems for deep space probes and orbital spacecraft. One attack on the problem of experimentally determining bit error rates in such systems is the standard concept of bit error testing, i.e., comparing transmitted and received digital information bit by bit. When either error rates or bit rates are low, considerable test time is required to establish error rates by this method. This paper presents an application of the statistics of extreme values to the problem of estimation of low error probabilities in binary communication systems, with special reference to systems which have ??loss-of-lock?? indicators. The idea of the extreme-value theory method is to record the maxima within a large group of successive independent samples of the detector analog signal just prior to quantization, and then in turn record a large number of these maxima themselves. Next, the two parameters of the double exponential extreme-value probability distribution are estimated. The probability of exceeding the error threshold is then calculated from knowledge of these two parameters. The presence of a loss-of-lock indicator reduces the error probability at the expense of introducing an ??erasure?? probability. Techniques are given for estimating both these probabilities using ??bivariate?? extreme-value theory.
Keywords :
Bit error rate; Bit rate; Communication systems; Error analysis; Error probability; Estimation error; Probes; Space vehicles; System testing; Telemetry;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9251
Type :
jour
DOI :
10.1109/TAES.1966.4501877
Filename :
4501877
Link To Document :
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