Title :
CVD diamond films for radiation detection
Author :
Foulon, F. ; Pochet, T. ; Gheeraert, E. ; Deneuville, A.
Author_Institution :
Centre d´´Etudes de Saclay, CEA, Gif-sur-Yvette, France
fDate :
8/1/1994 12:00:00 AM
Abstract :
Diamond films produced by microwave plasma enhanced chemical vapor deposition (CVD) technique have been used to fabricate radiation detectors. The polycrystalline diamond films have a measured resistivity of 1012 Ω.cm, a carrier mobility of 280 cm2/V.s and a carrier lifetime of about 530 ps. The detector response to laser pulses (λ=355, 532 and 1064 nm), X-ray flux (15-50 keV) and alpha particles (241Am, 5.49 MeV) has been investigated. The response speed of the detector is in the 100 ps range. A sensitivity of about 3×10-10A/V.(Gy/s) was measured under a 50 keV X-ray flux. The detector current response to X-ray flux is almost linear. It is also shown that CVD diamond detectors can be used for alpha particle counting
Keywords :
CVD coatings; X-ray detection and measurement; alpha-particle detection and measurement; carrier lifetime; carrier mobility; diamond; electronic conduction in crystalline semiconductor thin films; elemental semiconductors; semiconductor counters; semiconductor thin films; 100 ps; 1064 nm; 15 to 50 keV; 355 nm; 5.49 MeV; 532 nm; C; CVD; X-ray; alpha particle counting; alpha particles; carrier lifetime; carrier mobility; chemical vapor deposition; diamond films; laser pulse; microwave plasma; radiation detector; resistivity; response speed; semiconductor; sensitivity; Alpha particles; Chemical vapor deposition; Conductivity; Microwave theory and techniques; Plasma chemistry; Plasma measurements; Radiation detectors; X-ray detection; X-ray detectors; X-ray lasers;
Journal_Title :
Nuclear Science, IEEE Transactions on
