DocumentCode
1176654
Title
Very high resolution detection of gamma radiation at room-temperature using p-i-n detectors of CdZnTe and HgCdTe
Author
Hamilton, W.J. ; Rhiger, D.R. ; Sen, S. ; Kalisher, M.H. ; James, K. ; Reid, C.P. ; Gerrish, V. ; Baccash, C.O.
Author_Institution
Santa Barbara Res. Centre, Hughes Aircraft Co., Goleta, CA, USA
Volume
41
Issue
4
fYear
1994
fDate
8/1/1994 12:00:00 AM
Firstpage
989
Lastpage
992
Abstract
High-energy photon detectors have been constructed by engineering and fabricating p-i-n diode structures consisting of bulk CdZnTe and epitaxial HgCdTe. The p-i-n structure was obtained by liquid-phase epitaxial growth of p and n doped HgCdTe layers on “intrinsic” CdZnTe material about 1 mm thick and approximately 25 mm square. Curve tracing shows I-V curves with diode characteristics having resistivity above 1011Ω-cm and leakage current of <400 pA to about -60 V reverse bias on a typical rest piece approximately 5×8×1 mm. Spectra of similar test pieces have been obtained at room temperature with various nuclear isotopic sources over the range of 22 keV to 662 keV which show exceptionally high energy resolution. Resolution as good as 1.82% FWHM was obtained for the 356 keV line of 133Ba with a P/V=3.4. The performance of these detectors combined with contemporary infrared technology capable of fabricating 2D arrays of these II-VI materials opens up manifold exciting applications in astrophysics, medical, industrial, environmental, and defense spectroscopy and imaging
Keywords
II-VI semiconductors; gamma-ray detection and measurement; leakage currents; p-i-n diodes; semiconductor counters; 22 to 662 keV; 25 mm; 293 K; 400 pA; CdZnTe; HgCdTe; I-V curves; energy resolution; high resolution gamma ray detection; leakage current; p-i-n diode; resistivity; reverse bias; room-temperature; Conductivity; Energy resolution; Epitaxial growth; Gamma ray detection; Gamma ray detectors; Gamma rays; Infrared detectors; P-i-n diodes; PIN photodiodes; Radiation detectors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.322845
Filename
322845
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