A high rate, low noise, X-ray silicon strip detector system

Author

Ludewigt, B. ; Jaklevic, J. ; Kipnis, I. ; Rossington, C. ; Spieler, H.

Author_Institution

Lawrence Berkeley Lab., California Univ., Berkeley, CA, USA

Volume

41

Issue

4

fYear

1994

fDate

8/1/1994 12:00:00 AM

Firstpage

1037

Lastpage

1041

Abstract

An X-ray detector system, based on a silicon strip detector wire-bonded to a low noise charge-sensitive amplifier integrated circuit, has been developed for synchrotron radiation experiments which require very high count rates and good energy resolution. Noise measurements and X-ray spectra were taken using a 6 mm long, 55 μm pitch strip detector in conjunction with a prototype 16-channel charge-sensitive preamplifier, both fabricated using standard 1.2 μm CMOS technology. The detector system currently achieves an energy resolution of 350 eV FWHM at 5.9 keV, 2 μs peaking time, when cooled to -5°C

Keywords

X-ray apparatus; X-ray detection and measurement; preamplifiers; semiconductor counters; semiconductor device noise; 2 mus; 268 degC; 5.9 keV; 55 mum; 6 mm; CMOS; Si; Si strip detector; X-ray detector system; X-ray spectra; energy resolution; high count rates; low noise charge-sensitive amplifier; CMOS technology; Energy resolution; Integrated circuit noise; Low-noise amplifiers; Radiation detectors; Silicon radiation detectors; Strips; Synchrotron radiation; X-ray detection; X-ray detectors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.322854

Filename

322854