DocumentCode :
1176881
Title :
An analog front-end bipolar-transistor integrated circuit for the SDC silicon tracker
Author :
Kipnis, I. ; Spieler, H. ; Collins, T.
Author_Institution :
Lawrence Berkeley Lab., California Univ., Berkeley, CA, USA
Volume :
41
Issue :
4
fYear :
1994
fDate :
8/1/1994 12:00:00 AM
Firstpage :
1095
Lastpage :
1103
Abstract :
A low-noise, low-power, high-bandwidth, radiation hard, silicon bipolar-transistor full-custom integrated circuit (IC) containing 64 channels of analog signal processing has been developed for the SDC silicon tracker The IC was designed and tested at LBL and was fabricated using AT&T´s CBIC-U2, 4 GHz fτ complementary bipolar technology. Each channel contains the following functions: low-noise preamplification, pulse shaping and threshold discrimination. This is the first iteration of the production analog IC for the SDC silicon tracker. The IC is laid out to directly match the 50 μm pitch double-sided silicon strip detector. The chip measures 6.8 mm×3.1 mm and contains 3,600 transistors. Three stages of amplification provide 180 mV/fC of gain with a 35 nsec peaking time at the comparator input. For a 14 pF detector capacitance, the equivalent noise charge is 1300 el. RMS at a power consumption of 1 mW/channel from a single 3.5 V supply. With the discriminator threshold set to 4 times the noise level, a 16 nsec time-walk for 1.25 to 10 fC signals is achieved using a time-walk compensation network. Irradiation tests at TRIUMF to a Φ=1014 protons/cm2 have been performed on the IC, demonstrating the radiation hardness of the complementary bipolar process
Keywords :
bipolar integrated circuits; detector circuits; discriminators; elemental semiconductors; linear integrated circuits; nuclear electronics; preamplifiers; pulse shaping circuits; semiconductor counters; silicon; 14 pF; 3.1 mm; 3.5 V; 35 ns; 4 GHz; 6.8 mm; SDC Si tracker; Si; analog front-end bipolar-transistor integrated circuit; analog signal processing; comparator input; complementary bipolar technology; detector capacitance; discriminator threshold; equivalent noise charge; gain; high-bandwidth; low-noise circuit; low-noise preamplification; low-power circuit; peaking time; pitch double-sided Si strip detector; power consumption; production analog IC; pulse shaping; radiation hardness; threshold discrimination; time-walk compensation network; Analog integrated circuits; Bipolar integrated circuits; Bipolar transistors; Circuit testing; Detectors; Integrated circuit technology; Integrated circuit testing; Signal design; Signal processing; Silicon;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.322865
Filename :
322865
Link To Document :
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