DocumentCode :
1176984
Title :
Signal Integrity and EMC/EMI Measurement Analysis of RF MEMS Devices via a Combined FETD/Higher Order FVTD Technique
Author :
Kantartzis, Nikolaos V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Thessaloniki
Volume :
45
Issue :
3
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
1404
Lastpage :
1407
Abstract :
The accurate modeling of modern radio-frequency microelectromechanical systems, tailored for broadband applications, is developed in this paper through a new 3-D domain decomposition technique. The proposed scheme blends a modified finite-element time domain and an enhanced finite-volume time-domain algorithm in general curvilinear coordinates to separate the total problem into smaller flexible regions and provide rapid signal-integrity estimations. Among its key features is the introduction of dual vector operators, both in space and time, which diminish the impact of inherent mesh errors and soothe intermodulation distortions. Adjacent subdomains are successfully treated by an equivalent surface current approach, without the need for simplified conventions. Numerical results, addressing comparisons of various structures with reference/measurement data, certify our method and reveal its applicability.
Keywords :
electromagnetic compatibility; electromagnetic interference; finite element analysis; finite volume methods; micromechanical devices; time-domain analysis; 3D domain decomposition technique; EMC/EMI measurement analysis; FETD technique; FVTD technique; RF MEMS devices; broadband applications; finite element time domain algorithm; finite volume time domain algorithm; radiofrequency microelectromechanical systems; signal integrity; Electromagnetic compatibility (EMC); RF microelectromechanical systems (MEMS); electromagnetic interference (EMI); time-domain methods;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2009.2012645
Filename :
4787401
Link To Document :
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