• DocumentCode
    1176984
  • Title

    Signal Integrity and EMC/EMI Measurement Analysis of RF MEMS Devices via a Combined FETD/Higher Order FVTD Technique

  • Author

    Kantartzis, Nikolaos V.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Thessaloniki
  • Volume
    45
  • Issue
    3
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    1404
  • Lastpage
    1407
  • Abstract
    The accurate modeling of modern radio-frequency microelectromechanical systems, tailored for broadband applications, is developed in this paper through a new 3-D domain decomposition technique. The proposed scheme blends a modified finite-element time domain and an enhanced finite-volume time-domain algorithm in general curvilinear coordinates to separate the total problem into smaller flexible regions and provide rapid signal-integrity estimations. Among its key features is the introduction of dual vector operators, both in space and time, which diminish the impact of inherent mesh errors and soothe intermodulation distortions. Adjacent subdomains are successfully treated by an equivalent surface current approach, without the need for simplified conventions. Numerical results, addressing comparisons of various structures with reference/measurement data, certify our method and reveal its applicability.
  • Keywords
    electromagnetic compatibility; electromagnetic interference; finite element analysis; finite volume methods; micromechanical devices; time-domain analysis; 3D domain decomposition technique; EMC/EMI measurement analysis; FETD technique; FVTD technique; RF MEMS devices; broadband applications; finite element time domain algorithm; finite volume time domain algorithm; radiofrequency microelectromechanical systems; signal integrity; Electromagnetic compatibility (EMC); RF microelectromechanical systems (MEMS); electromagnetic interference (EMI); time-domain methods;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2009.2012645
  • Filename
    4787401