Recent results from tests of fast analog-to-digital converters

Author

Crawley, H.B. ; McKay, R. ; Meyer, W.T. ; Rosenberg, E.I. ; Thomas, W.D.

Author_Institution

Dept. of Phys. & Astron., Iowa State Univ., Ames, IA, USA

Volume

41

Issue

4

fYear

1994

fDate

8/1/1994 12:00:00 AM

Firstpage

1181

Lastpage

1186

Abstract

We present results from tests of eight, ten, and twelve bit ADCs that operate in the range of 10 to 120 megasamples per second. We use a test bench and software we have developed to perform the tests on as wide a range of devices as possible. By testing devices with the same input signals, the same software, and the same parameter definitions, we make possible direct comparisons between competing devices. Important parameters measured include integral and differential nonlinearity, effective number of bits, and word error rate. While the tests are intended primarily to benefit the design of high rate physics experiments, the results are also useful to workers in other fields

Keywords

CAMAC; analogue-digital conversion; automatic test equipment; detector circuits; electronic equipment testing; nuclear electronics; signal processing equipment; 10 bit; 12 bit; 8 bit; ADCs; CAMAC; differential nonlinearity; effective number; fast analog-to-digital converters; high rate physics experiments; integral nonlinearity; software; test bench; word error rate; Analog-digital conversion; Astronomy; CAMAC; Electronic equipment testing; Laboratories; Manufacturing; Physics; Signal generators; Software performance; Software testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.322880

Filename

322880