Results of radiation hardness tests and performance tests of the HS9008RH flash ADC

Author

Nutter, S. ; Tarlé, G. ; Crawley, H.B. ; McKay, R. ; Meyer, W.T. ; Rosenberg, E.I. ; Thomas, W.D.

Author_Institution

Dept. of Phys., Michigan Univ., Ann Arbor, MI, USA

Volume

41

Issue

4

fYear

1994

fDate

8/1/1994 12:00:00 AM

Firstpage

1197

Lastpage

1202

Abstract

Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital convertor (FADC) are presented. These tests were performed primarily to evaluate the suitability of this device for use in the GEM Central Tracker at the SSC experiment. Basic performance characteristics and susceptibility of these characteristics to radiation were examined. Performance test results indicate that the device integral nonlinearity is sampling rate dependent and worsens rapidly above a sampling rate of 15 megasamples per second (MSPS). No degradation in performance of the device was observed after its exposure of up to 81 Mrad of 1.25 MeV γ radiation from a ⁶⁰Co source. Exposure of the device to a reactor fast neutron fluence (E>100 keV) of 5×10¹⁴/cm² resulted in no significant observed performance degradation as well

Keywords

analogue-digital conversion; application specific integrated circuits; detector circuits; gamma-ray effects; neutron effects; nuclear electronics; radiation hardening (electronics); γ radiation; 1.25 MeV; 100 keV; 81 Mrad; GEM Central Tracker; HS9008RH flash ADC; SSC; flash analog to digital convertor; neutron fluence; performance tests; radiation hardness tests; sampling rate dependent; Analog-digital conversion; Degradation; Ionizing radiation; Manufacturing processes; Neutrons; Performance evaluation; Physics; Radiation hardening; Sampling methods; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.322883

Filename

322883