• DocumentCode
    1177591
  • Title

    Schematic array models for associative and non-associative memory circuits

  • Author

    Bose, Soumitra ; Nandi, Amit

  • Author_Institution
    Test Technol. Group, Intel Corp., Folsom, CA, USA
  • Volume
    24
  • Issue
    10
  • fYear
    2005
  • Firstpage
    1582
  • Lastpage
    1593
  • Abstract
    The modeling and simulation of memory circuits remains an outstanding problem whenever accuracy with respect to the actual schematic implementation is desired. Functionally equivalent Register Transfer (RT) level models often cannot be used for designs with embedded memory blocks, because schematic models for the surrounding logic may be required for fault-modeling accuracy. Existing methods derive a latch model that essentially represents each memory location as a latch primitive. This approach results in models that have a large number of primitives. We present new algorithms that model such circuits as decoded arrays that access entire rows of cells for individual read and write operations. Decoded array models are easy to generate and allow fault-modeling accuracy for the surrounding logic, including the memory address decoder. Experimental data show improvements of an order of magnitude for both logic and fault simulations, when compared to the equivalent latch model.
  • Keywords
    circuit simulation; content-addressable storage; fault simulation; integrated circuit modelling; logic simulation; semiconductor storage; associative memory circuits; decoded array models; embedded memory blocks; fault modeling; fault simulation; logic simulation; memory address decoder; nonassociative memory circuits; schematic array models; switch-level modeling; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Decoding; Equations; Formal verification; Latches; Logic arrays; Logic testing; Fault simulation; logic simulation; switch-level modeling;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.852051
  • Filename
    1512375