DocumentCode :
1177612
Title :
Fault diagnosis and logic debugging using Boolean satisfiability
Author :
Smith, Alexander ; Veneris, Andreas ; Ali, Moayad Fahim ; Viglas, Anastasios
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada
Volume :
24
Issue :
10
fYear :
2005
Firstpage :
1606
Lastpage :
1621
Abstract :
Recent advances in Boolean satisfiability have made it an attractive engine for solving many digital very-large-scale-integration design problems. Although useful in many stages of the design cycle, fault diagnosis and logic debugging have not been addressed within a satisfiability-based framework. This work proposes a novel Boolean satisfiability-based method for multiple-fault diagnosis and multiple-design-error diagnosis in combinational and sequential circuits. A number of heuristics are presented that keep the method memory and run-time efficient. An extensive suite of experiments on large circuits corrupted with different types of faults and errors confirm its robustness and practicality. They also suggest that satisfiability captures significant characteristics of the problem of diagnosis and encourage novel research in satisfiability-based diagnosis as a complementary process to design verification.
Keywords :
Boolean algebra; VLSI; combinational circuits; computability; fault diagnosis; logic design; logic testing; sequential circuits; Boolean satisfiability; combinational circuits; digital very-large-scale-integration design; integrated circuit design; logic debugging; logic design; logic testing; multiple design error diagnosis; multiple fault diagnosis; sequential circuits; Boolean functions; Circuit faults; Debugging; Engines; Fault diagnosis; Logic design; Robustness; Runtime; Sequential circuits; Very large scale integration; Boolean satisfiability debugging; VLSI; design errors; diagnosis; faults; verification;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2005.852031
Filename :
1512377
Link To Document :
بازگشت