DocumentCode
1177632
Title
Evaluating the reliability of NAND multiplexing with PRISM
Author
Norman, Gethin ; Parker, David ; Kwiatkowska, Marta ; Shukla, Sandeep
Author_Institution
Sch. of Comput. Sci., Univ. of Birmingham, UK
Volume
24
Issue
10
fYear
2005
Firstpage
1629
Lastpage
1637
Abstract
Probabilistic-model checking is a formal verification technique for analyzing the reliability and performance of systems exhibiting stochastic behavior. In this paper, we demonstrate the applicability of this approach and, in particular, the probabilistic-model-checking tool PRISM to the evaluation of reliability and redundancy of defect-tolerant systems in the field of computer-aided design. We illustrate the technique with an example due to von Neumann, namely NAND multiplexing. We show how, having constructed a model of a defect-tolerant system incorporating probabilistic assumptions about its defects, it is straightforward to compute a range of reliability measures and investigate how they are affected by slight variations in the behavior of the system. This allows a designer to evaluate, for example, the tradeoff between redundancy and reliability in the design. We also highlight errors in analytically computed reliability bounds, recently published for the same case study.
Keywords
NAND circuits; circuit reliability; fault tolerance; formal verification; logic design; probabilistic logic; redundancy; NAND circuits; NAND multiplexing reliability; PRISM; circuit reliability; computer-aided design; defect-tolerant systems; formal verification technique; probabilistic-model checking; redundancy evaluation; reliability analysis; Computer network reliability; Design automation; Error analysis; Firewire; Formal verification; Performance analysis; Power system reliability; Redundancy; Stochastic systems; Wireless application protocol; Defect-tolerant architectures; multiplexing; probabilistic-model checking; reliability;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2005.852033
Filename
1512379
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