• DocumentCode
    1177632
  • Title

    Evaluating the reliability of NAND multiplexing with PRISM

  • Author

    Norman, Gethin ; Parker, David ; Kwiatkowska, Marta ; Shukla, Sandeep

  • Author_Institution
    Sch. of Comput. Sci., Univ. of Birmingham, UK
  • Volume
    24
  • Issue
    10
  • fYear
    2005
  • Firstpage
    1629
  • Lastpage
    1637
  • Abstract
    Probabilistic-model checking is a formal verification technique for analyzing the reliability and performance of systems exhibiting stochastic behavior. In this paper, we demonstrate the applicability of this approach and, in particular, the probabilistic-model-checking tool PRISM to the evaluation of reliability and redundancy of defect-tolerant systems in the field of computer-aided design. We illustrate the technique with an example due to von Neumann, namely NAND multiplexing. We show how, having constructed a model of a defect-tolerant system incorporating probabilistic assumptions about its defects, it is straightforward to compute a range of reliability measures and investigate how they are affected by slight variations in the behavior of the system. This allows a designer to evaluate, for example, the tradeoff between redundancy and reliability in the design. We also highlight errors in analytically computed reliability bounds, recently published for the same case study.
  • Keywords
    NAND circuits; circuit reliability; fault tolerance; formal verification; logic design; probabilistic logic; redundancy; NAND circuits; NAND multiplexing reliability; PRISM; circuit reliability; computer-aided design; defect-tolerant systems; formal verification technique; probabilistic-model checking; redundancy evaluation; reliability analysis; Computer network reliability; Design automation; Error analysis; Firewire; Formal verification; Performance analysis; Power system reliability; Redundancy; Stochastic systems; Wireless application protocol; Defect-tolerant architectures; multiplexing; probabilistic-model checking; reliability;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.852033
  • Filename
    1512379