DocumentCode :
1177740
Title :
Measurement of the dielectric constant and loss tangent of high dielectric-constant materials at terahertz frequencies
Author :
Bolivar, Peter Haring ; Brucherseifer, Martin ; Rivas, Jaime Gómez ; Gonzalo, Ramón ; Ederra, Iñigo ; Reynolds, Andrew L. ; Holker, M. ; De Maagt, Peter
Author_Institution :
Inst. fur Halbleitertechnik, Rheinisch-Westfalische Tech. Hochschule, Aachen, Germany
Volume :
51
Issue :
4
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
1062
Lastpage :
1066
Abstract :
Low-loss high dielectric-constant materials are analyzed in the terahertz frequency range using time-domain spectroscopy. The dielectric constant and loss tangent for steatite, alumina, titania loaded polystyrene, and zirconium-tin-titanate are presented and compared to measurements on high-resistivity silicon. For these materials, the real part of the dielectric constant ranges from 6 to 90. All of the samples were found to have reasonable low-loss tangents. Applications as photonic crystal substrates for terahertz frequency antenna are envisaged.
Keywords :
alumina; dielectric loss measurement; permittivity measurement; photonic crystals; submillimetre wave measurement; submillimetre wave spectroscopy; substrates; 300 GHz to 5 THz; Al2O3; PBG crystals; THF antennas; TiO2; ZrSnTiO3; alumina; dielectric-constant measurements; high dielectric-constant materials; high-resistivity Si; loss tangent measurements; low-loss materials; photonic crystal substrates; steatite; submillimeter waves; terahertz frequencies; time-domain spectroscopy; titania loaded polystyrene; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency measurement; Loss measurement; Submillimeter wave measurements; Time domain analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2003.809693
Filename :
1193114
Link To Document :
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