Title :
Calibrated measurement of optoelectronic frequency response
Author :
Hale, Paul D. ; Williams, Dylan F.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
4/1/2003 12:00:00 AM
Abstract :
Describes the most straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.
Keywords :
S-matrix theory; calibration; network analysers; optical receivers; optoelectronic devices; calibrated measurement; calibrated optical reference receiver; electrical vector network analyzer; modulated optical source; optoelectronic devices; optoelectronic frequency response; scattering matrix formalism; Calibration; Chirp modulation; Frequency measurement; Frequency response; Light scattering; Optical modulation; Optical receivers; Optical scattering; Optoelectronic devices; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2003.809186
