DocumentCode :
1178466
Title :
A 1.2 GSample/s Double-Switching CMOS THA With {- } 62 dB THD
Author :
Dinç, Hüseyin ; Allen, Phillip E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
Volume :
44
Issue :
3
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
848
Lastpage :
861
Abstract :
Hold-mode feed-through is an important design problem, which plagues the classical switched-buffer track-and-hold amplifier (THA) topologies. The cross-coupled capacitor technique is a simple way of reducing hold-mode feed-through. However, the reduction in hold-mode feed-through is dependent on the matching between the cross-coupled capacitors and the inherent feed-forward capacitors. A double-switching switched-buffer THA is proposed, which has a switching input buffer. The proposed technique results in exceptional hold-mode isolation without the usage of the cross-coupled capacitor technique. Under Nyquist-rate sampling, 62 dB spurious-free-dynamic-range (SFDR), and 10 bit accuracy are achieved with input frequencies up to 800 MHz and 600 MHz respectively. Two prototype chips are designed in a 0.18 mum CMOS process. To maximize speed and dynamic range, the THA makes use of both 3.3 and 1.8 V devices, and uses 3.3 V analog supply voltage. Where necessary, 3.3 V devices cascode the 1.8 V devices for safe operation. The performance of the THA is comparable to most bipolar designs, both in speed and accuracy.
Keywords :
CMOS integrated circuits; Nyquist criterion; amplifiers; Nyquist-rate sampling; classical switched-buffer track-and-hold amplifier; cross-coupled capacitor technique; double-switching CMOS; feed-forward capacitors; frequency 600 MHz; frequency 800 MHz; hold-mode feed-through reduction; size 0.18 mum; spurious-free-dynamic-range; voltage 1.8 V; voltage 3.3 V; Analog-digital conversion; Capacitors; Clocks; Digital signal processing; Feedforward systems; Frequency; Sampling methods; Schottky diodes; Signal processing; Topology; Low distortion; SHA; THA; switched buffer; track-and-hold;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2008.2010786
Filename :
4787565
Link To Document :
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