• DocumentCode
    1178537
  • Title

    Refractive index profiling-state of the art

  • Author

    Raine, K.W. ; Baines, J.G.N. ; Putland, D.E.

  • Author_Institution
    NPL, Teddington, UK
  • Volume
    7
  • Issue
    8
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    1162
  • Lastpage
    1169
  • Abstract
    Problems associated with different calibration techniques and some instrumental effects that can determine instrumental accuracy are discussed. It is shown how transmission effects can be observed and used to generate a correction curve for refracted near-field instruments. High-quality fiber slices needed for axial interferometry were used to obtain refractive index differences on suitable fibers to ±1% with the measurements traceable to national standards. Interferometry was used to calibrate a multiple-step fiber which is available in 10-m lengths with a certificate of calibration. The limitations of the technique are discussed, and preliminary results of a study on the effects of residual stress and stress relief on measurements are given. Comparisons are made between measurements made by axial interferometry and refracted near field on a range of fibers. It is shown that commercial profilers can produce reliable measurements of refractive index difference, absolute refractive index, profile shape, and numerical aperture that agree well with measurements by other techniques
  • Keywords
    calibration; internal stresses; light interferometry; optical fibres; refractive index measurement; absolute refractive index; axial interferometry; calibration techniques; correction curve; high quality fiber slices; multiple-step fiber; numerical aperture; profile shape; refracted near-field instruments; refractive index difference; refractive index profiling; residual stress; stress relief; transmission effects; Apertures; Art; Calibration; Instruments; Interferometry; Measurement standards; Refractive index; Residual stresses; Shape measurement; Stress measurement;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.32377
  • Filename
    32377