Submillimeter optical reflectometry

Author

Gilgen, H.H. ; Novàk, R.P. ; Salathé, R.P. ; Hodel, W. ; Beaud, P.

Author_Institution

Tech. Center, Swiss PTT, Berne, Switzerland

Volume

7

Issue

8

fYear

1989

fDate

8/1/1989 12:00:00 AM

Firstpage

1225

Lastpage

1233

Abstract

The development of optical reflectometers with a spatial resolution in the submillimeter range is reviewed. Optical time-domain reflectometers (OTDRs) and optical low-coherence reflectometers (OLCRs) for nondestructive diagnostics of waveguide devices are discussed. Techniques, system performances, and experimental results are discussed for OTDRs and for OLCRs. Fields of applications for these techniques are indicated, and some preliminary conclusions are presented. A dynamic range of ~100 dB and a spatial resolution in the range of 10-60 μm were achieved with both types of reflectometers. Nondestructive diagnostics on waveguide components and integrated optics circuits are feasible at these performance levels

Keywords

integrated optics; optical waveguide components; reflectometers; reflectometry; reviews; time-domain reflectometry; OTDRs; nondestructive diagnostics; optical low-coherence reflectometers; submillimeter spatial resolution; waveguide devices; Frequency; Optical attenuators; Optical harmonic generation; Optical mixing; Optical modulation; Optical receivers; Optical waveguides; Reflectometry; Spatial resolution; Stimulated emission;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.32387

Filename

32387