DocumentCode
1178703
Title
Optical and Interferometric Lithography - Nanotechnology Enablers
Author
Brueck, S.R.J.
Author_Institution
New Mexico Univ., Albuquerque, NM, USA
Volume
93
Issue
10
fYear
2005
Firstpage
1704
Lastpage
1721
Abstract
Interferometric lithography (IL), the interference of a small number of coherent optical beams, is a powerful technique for the fabrication of a wide array of samples of interest for nanoscience and nanotechnology. The techniques and limits of IL are discussed with particular attention to the smallest scales achievable. With immersion techniques, the smallest pattern size for a single exposure is a half-pitch of λ/4n where λ is the optical wavelength and n is the refractive index of the immersion material. Currently with a 193-nm excimer laser source and H2O immersion, this limiting dimension is ∼34 nm. With nonlinear spatial frequency multiplication techniques, this limit is extended by factors of 1/2, 1/3, etc.-extending well into the nanoscale regime. IL provides an inexpensive, large-area capability as a result of its parallelism. Multiple exposures, multiple beams, and mix-and-match with other lithographies extend the range of applicability. Imaging IL provides an approach to arbitrary structures with comparable resolution. Numerous application areas, including nanoscale epitaxial growth for semiconductor heterostructures; nanofluidics for biological separations; nanomagnetics for increased storage density; nanophotonics including distributed feedback and distributed Bragg reflectors, two- and three-dimensional photonic crystals, metamaterials, and negative refractive index materials for enhanced optical interactions are briefly reviewed.
Keywords
excimer lasers; light interference; light interferometry; metamaterials; nanolithography; ultraviolet lithography; 193 nm; H2O; excimer laser source; immersion lithography; interferometric lithography; metamaterials; multiple beams; multiple exposures; nanofluidics; nanomagnetics; nanophotonics; nanotechnology enablers; negative-index materials; nonlinear spatial frequency multiplication; optical beams; optical lithography; Biomedical optical imaging; Interferometric lithography; Nanobioscience; Nanotechnology; Nonlinear optics; Optical beams; Optical feedback; Optical interferometry; Optical refraction; Optical variables control; Epitaxy; interference; lithography; metamaterials; nanofluidics; nanomagnetics; nanophotonics; nanoscience; nanotechnology; negative-index materials;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/JPROC.2005.853538
Filename
1512492
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