DocumentCode
1178856
Title
Parallel simulated annealing: accuracy vs. speed in placement
Author
Durand, M.D.
Author_Institution
Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
Volume
6
Issue
3
fYear
1989
fDate
6/1/1989 12:00:00 AM
Firstpage
8
Lastpage
34
Abstract
The techniques that researchers have used to control error in VLSI placement are surveyed. The author discusses the application of parallelism, synchronization with serial subsets, combining algorithms, periodic synchronization, shared-memory implementation, local-memory implementation, and connection Machine implementation. The issues of temporary versus cumulative error, task allocation, and error measurements are examined.<>
Keywords
VLSI; circuit layout CAD; parallel algorithms; VLSI placement; accuracy; combining algorithms; connection Machine implementation; error measurements; local-memory implementation; parallel simulated annealing; parallelism; periodic synchronization; shared-memory implementation; speed; synchronization; task allocation; Circuit simulation; Computational modeling; Computer simulation; Costs; Optimization methods; Routing; Simulated annealing; Solids; Temperature; Tin;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.32410
Filename
32410
Link To Document