DocumentCode
11794
Title
A Reconfigurable Single-Photon-Counting Integrating Receiver for Optical Communications
Author
Fisher, Eli ; Underwood, I. ; Henderson, Robert
Author_Institution
Inst. for Integrated Micro & Nano Syst., Univ. of Edinburgh, Edinburgh, UK
Volume
48
Issue
7
fYear
2013
fDate
Jul-13
Firstpage
1638
Lastpage
1650
Abstract
A reconfigurable Single-Photon Avalanche Diode integrating receiver in standard 130 nm CMOS is presented for optical links with an array readout bandwidth of 100 MHz. A maximum count rate of 58 G photon/s is observed, with a dynamic range of ≈ 79 dB, a sensitivity of ≈ - 31.7 dBm at 100 MHz and a BER of ≈ 1 ×10-9. The sensor core draws 89 mW at the maximum count rate and obtains a peak SNR of ≈157 dB. We investigate the properties of the receiver for optical communications in the visible spectrum, using its added functionality and reconfigurability to experimentally explore non-ideal influences. The all-digital 32 × 32 SPAD array, achieves a minimum dead time of 5.9 ns, and a median dark count rate of 2.5 kHz/SPAD. The internal gain of SPADs and spatio-temporal summation removes the need for analogue amplification. High noise devices can be weighted or removed to optimize the SNR. The power requirements, transient response and received data are explored and limiting factors similar to those of photodiode receivers are observed.
Keywords
CMOS integrated circuits; avalanche diodes; avalanche photodiodes; error statistics; optical links; optical receivers; photon counting; transient response; BER; CMOS; SNR; SPAD array; analogue amplification; array readout bandwidth; bandwidth 100 MHz; high noise device; optical communication; optical link; photodiode receiver; power 89 mW; power requirement; reconfigurable single-photon avalanche diode integrating receiver; reconfigurable single-photon-counting integrating receiver; sensor core; size 130 nm; spatio-temporal summation; time 5.9 ns; transient response; visible spectrum; Arrays; Bit error rate; Jitter; Noise; Photonics; Receivers; Sensitivity; CMOS; IEEE802.15.7; OEIC; integrated; integrating receiver; interchip; low-light receiver; photon counting; single-photon avalanche diode (SPAD); visible light communications (VLCs);
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2013.2253222
Filename
6495487
Link To Document