Title :
Test Techniques for Transient Radiation Effects
Author :
van Lint, V.A.J. ; Poll, R.A.
Author_Institution :
General Atomic Division of General Dynamics Corporation, John Jay Hopkins Laboratory for Pure and Applied Science, San Diego, California
Abstract :
This paper gives examples of specific test techniques which have been used in performing transient radiation effects test measurements. The techniques were developed primarily for use with electron linear accelerators but can be applied directly in flash X-ray and pulsed reactor test programs as well.
Keywords :
Atomic measurements; Circuit testing; Electromagnetic interference; Electrons; Gamma rays; Inductors; Laboratories; Linear accelerators; Performance evaluation; Radiation effects;
Journal_Title :
Aerospace and Navigational Electronics, IEEE Transactions on
DOI :
10.1109/TANE.1963.4502235
