DocumentCode :
1180075
Title :
Trading Off Cache Capacity for Low-Voltage Operation
Author :
Wilkerson, Chris ; Gao, Hongliang ; Alameldeen, Alaa R. ; Chishti, Zeshan ; Khellah, Muhammad ; Lu, Shih-Lien
Volume :
29
Issue :
1
fYear :
2009
Firstpage :
96
Lastpage :
103
Abstract :
Two proposed techniques let microprocessors operate at low voltages despite high memory-cell failure rates. They identify and disable defective portions of the cache at two granularities: individual words or pairs of bits. Both techniques use the entire cache during high-voltage operation while sacrificing cache capacity during low-voltage operation to reduce the minimum voltage below 500 mV.
Keywords :
cache storage; microprocessor chips; cache capacity; memory-cell failure rates; microprocessors; voltage 500 mV; Circuits; Delay; Energy consumption; Error correction; Error correction codes; Low voltage; Manufacturing; Microprocessors; Power supplies; Random access memory;
fLanguage :
English
Journal_Title :
Micro, IEEE
Publisher :
ieee
ISSN :
0272-1732
Type :
jour
DOI :
10.1109/MM.2009.20
Filename :
4796173
Link To Document :
بازگشت