Title :
Characterization of the perturbation effect of a probe head using the FD-TD method
Author :
Qian, Yongxi ; Iwata, Shin-ichirou ; Yamashita, Eikichi
Author_Institution :
Univ. of Electro-Commun., Tokyo, Japan
Abstract :
The perturbation effect of a probe head in microwave measurement is investigated by using the FD-TD method. A two-simulation approach with improved accuracy is employed to predict the insertion loss caused by the probe head. Depending on the diameter and reclining angle of the probe head, a maximum insertion loss of up to 0.8 dB has been calculated for an example structure. This work provides a rigorous and quantitative estimation of the probe effect. The analysis results may also serve as a guidance for optimal designing and positioning of probe heads so that a minimum field perturbation during measurement can be expected.<>
Keywords :
finite difference time-domain analysis; microwave measurement; probes; 0.8 dB; FD-TD method; diameter; field perturbation; insertion loss; microwave measurement; optimal designing; optimal positioning; probe head; reclining angle; two-simulation; Circuit testing; Conductors; Frequency; Insertion loss; Microstrip; Microwave devices; Microwave measurements; Microwave theory and techniques; Position measurement; Probes;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
