Title :
Enhancing Bilinear Subspace Learning by Element Rearrangement
Author :
Xu, Dong ; Yan, Shuicheng ; Lin, Stephen ; Huang, Thomas S. ; Chang, Shih-Fu
Author_Institution :
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
The success of bilinear subspace learning heavily depends on reducing correlations among features along rows and columns of the data matrices. In this work, we study the problem of rearranging elements within a matrix in order to maximize these correlations so that information redundancy in matrix data can be more extensively removed by existing bilinear subspace learning algorithms. An efficient iterative algorithm is proposed to tackle this essentially integer programming problem. In each step, the matrix structure is refined with a constrained earth mover´s distance procedure that incrementally rearranges matrices to become more similar to their low-rank approximations, which have high correlation among features along rows and columns. In addition, we present two extensions of the algorithm for conducting supervised bilinear subspace learning. Experiments in both unsupervised and supervised bilinear subspace learning demonstrate the effectiveness of our proposed algorithms in improving data compression performance and classification accuracy.
Keywords :
approximation theory; data compression; data reduction; integer programming; iterative methods; linear programming; matrix algebra; pattern classification; unsupervised learning; bilinear subspace supervised learning algorithm; correlation maximization; data classification; data compression; data matrix element rearrangement; dimensionality reduction; earth mover´s distance procedure; information redundancy; integer programming problem; iterative algorithm; low-rank approximation; unsupervised learning algorithm; Bilinear subspace learning; dimensionality reduction.; earth mover´s distance; element rearrangement; Algorithms; Artificial Intelligence; Data Compression; Face; Normal Distribution;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2009.51