Title :
The bispectrum of sampled data. II. Monte-Carlo simulations of detection and estimation of the sampling jitter
Author :
Sharfer, Ilan ; Messer, Hagit
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fDate :
10/1/1994 12:00:00 AM
Abstract :
For pt.I see IEEE Trans. Acoust. Speech, Signal Process., vol.41, no.1, p.296-312 (1993). The effect of jitter in sampling on the spectrum and bispectrum of the sampled data has been considered previously. Methods of detecting the presence of jitter in a uniform sampling process and of estimating its variance based on a test statistic calculated from the bispectrum estimates have been proposed. The present authors demonstrate, by means of Monte-Carlo simulations, how these results can be applied in an actual case. For this purpose, samples taken from a stationary band-limited process in sampling times given by a random jitter process are generated by computer. The authors then apply the jitter detection and estimation methods that have been developed in previous work and study how their performance depends on signal duration and on jitter variance. They examine the actual simulation results concerning detection probability, estimation bias, and estimation variance in comparison with the theoretical results. This comparison indicates that the bispectrum is a domain where jitter detection and estimation with high performance can be achieved, provided that a signal with sufficiently long duration and high skewness is available
Keywords :
Monte Carlo methods; digital simulation; parameter estimation; random processes; signal detection; spectral analysis; Monte-Carlo simulations; bispectrum; detection; estimation; estimation bias; estimation variance; jitter variance; performance; random jitter process; sampled data; sampling jitter; sampling times; signal duration; skewness; stationary band-limited process; Analysis of variance; Computational modeling; Sampling methods; Signal analysis; Signal processing; Signal sampling; Statistical analysis; System performance; Testing; Timing jitter;
Journal_Title :
Signal Processing, IEEE Transactions on