Title :
A Silicon Diode Circuit for Direct Measurement of the WBGT Thermal Stress Index
Author_Institution :
Physics Dept. of the Technion, Haifa, Israel.
Abstract :
A simple instrument is described for the assessment of a thermal environment by continuous monitoring and computation of the Wet-Bulb Globe Thermometer (WBGT) heat stress index. Silicon diodes are used as the temperature transducers. A simple resistive network for weighted summation of the voltages has been developed. The instrument is battery-operated and suitable for laboratory and field work. Monitoring and recording is possible from a remote site.
Keywords :
Circuits; Diodes; Instruments; Monitoring; Silicon; Stress measurement; Temperature; Thermal stresses; Transducers; Voltage; Electronics; Engineering; Thermometers;
Journal_Title :
Biomedical Engineering, IEEE Transactions on
DOI :
10.1109/TBME.1965.4502339
