Accurate spectral characterization of polarization-dependent loss

Building on previous work, a rapid automated nonmechanical measurement system for spectral characterization of polarization-dependent loss (PDL) has been developed. A deterministic fixed-states Mueller-Stokes method in conjunction with realtime calibrated spectral information is used to derive wavelength-dependent Mueller matrix elements. Voltage-modulated liquid-crystal variable retarders set the input polarization states. A narrow voltage-tuned filter provides a wavelength sweep following a broadband source; the sweep wavelength is calibrated in realtime by hydrogen cyanide reference lines. This rapid measurement system can measure PDL over a wavelength range of 15 nm in 5 s. A complete uncertainty analysis has been conducted for PDL in the range of 0.05 to 0.3 dB with an expanded uncertainty of 0.0098 dB over the range of 1535 to 1560 nm. Performance was verified using a Fresnel reference. Finally, design and performance results from all-fiber artifact calibration standards are presented.