DocumentCode
1181374
Title
Nanowire Crossbar Logic and Standard Cell-Based Integration
Author
Dong, Mian ; Zhong, Lin
Author_Institution
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
Volume
17
Issue
8
fYear
2009
Firstpage
997
Lastpage
1007
Abstract
Nanowire crossbar is one of the most promising circuit solutions for nanoelectronics. However, it is still unclear whether or how they can be competitive in implementing logic circuits, as compared to their MOSFET counterparts. We analyze nanowire crossbars in area, speed, and power, in comparison with their MOSFET counterparts. We show nanowire crossbars do not scale well in terms of logic density and speed. To achieve performance close to their MOSFET counterparts, crossbar circuits need faster field-effect transistors (FETs) to compensate the high resistance of nanowires. Motivated by the analysis and comparative study, we propose a crossbar cells design based on judicious use of silicon nanowires. The crossbar cell is compatible with the conventional MOSFET fabrication and design methodologies, in particular, standard cell-based integrated circuit design. We evaluate logic circuits synthesized with crossbar cells and MOSFET cells based on the MCNC91 benchmark. The results show that crossbar cells can provide a density advantage of more than four times over the traditional MOSFET circuits with the same process technology, while achieving close performance and consuming less than one third power.
Keywords
MOSFET circuits; elemental semiconductors; field effect transistors; logic circuits; logic design; nanoelectronics; nanowires; silicon; MCNC91 benchmark; MOSFET circuits; Si; crossbar cells design; field-effect transistors; logic circuits; nanoelectronics; nanowire crossbar logic; standard cell-based integrated circuit design; standard cell-based integration; Crossbar; VLSI; logic synthesis; nanotechnology; nanowire;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2008.2002303
Filename
4796293
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