Title :
Analysis of a line-defect waveguide on a silicon-on-insulator two-dimensional photonic-Crystal slab
Author :
Tanaka, Yoshinori ; Asano, Takashi ; Hatsuta, Ranko ; Noda, Susumu
Author_Institution :
Dept. of Electron. Sci. & Eng., Kyoto Univ., Japan
Abstract :
This paper describes the investigation of the waveguide properties of a silicon-on-insulator (SOI)-based two-dimensional photonic-crystal slab. It is found that coupling between transverse-electric (TE)-like defect modes and transverse-magnetic (TM)-like slab modes occurs in some frequency range due to structural asymmetries in the vertical direction. This TE-TM coupling, together with the smaller refractive-index contrast between the slab and dielectric cladding, results in propagation losses for a line-defect waveguide in an SOI structure. The paper also presents optimization methods for obtaining a wide lossless propagation band using such a line defect.
Keywords :
optical couplers; optical losses; optical waveguides; optimisation; photonic crystals; refractive index; silicon-on-insulator; Si; TE-TM coupling; dielectric cladding; line defect; line-defect waveguide; optimization methods; propagation losses; refractive-index contrast; silicon-on-insulator; structural asymmetries; transverse-electric-like defect modes; transverse-magnetic-like slab modes; two-dimensional photonic crystal slab; waveguide properties; wide lossless propagation band; Dielectrics; Optical filters; Optical materials; Optical propagation; Optical refraction; Optical waveguides; Photonic band gap; Propagation losses; Silicon on insulator technology; Slabs; Line-defect waveguide; TE–TM coupling; photonic-crystal slab; propagation loss; silicon-on-insulator;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2004.833290
