• DocumentCode
    1182052
  • Title

    Loss distribution measurement of silica-based waveguides by using a jaggedness-free optical low coherence reflectometer

  • Author

    Takada, Ryoki ; Yamada, Hiroyoshi ; Horiguchi, M.

  • Author_Institution
    NTT Opto-Electron. Labs., Ibaraki
  • Volume
    30
  • Issue
    17
  • fYear
    1994
  • fDate
    8/18/1994 12:00:00 AM
  • Firstpage
    1441
  • Lastpage
    1443
  • Abstract
    The loss distributions in silica-based waveguides are successfully measured using a jaggedness-free optical reflectometer (OLCR). The OLCR reduces jagged fluctuations which appear in Rayleigh backscattering measurements undertaken with conventional OLCRs to within ±1 dB by averaging the wavelength-dependent Rayleigh backscatter signals. Constant loss distributions and a step-like loss increase in the waveguides were clearly observed
  • Keywords
    Rayleigh scattering; optical loss measurement; optical losses; optical waveguides; reflectometry; silicon compounds; Rayleigh backscattering measurements; jaggedness-free optical low coherence reflectometer; loss distribution measurement; silica-based waveguides; step-like loss increase; wavelength-dependent Rayleigh backscatter signals;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19940986
  • Filename
    326279
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1182052