DocumentCode

1182066

Title

Editorial

Author

Bedrosian, S.

Volume

26

Issue

7

fYear

1979

fDate

7/1/1979 12:00:00 AM

Firstpage

409

Lastpage

410

Keywords

Analog integrated circuits; Automatic testing; Fault diagnosis; Integrated circuit testing; Integrated circuits, analog; Special issues;

fLanguage

English

Journal_Title

Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0098-4094

Type

jour

DOI

10.1109/TCS.1979.1084654

Filename

1084654