Title :
Susceptibility of lithium-niobate modulator to high-power microwave pulses
Author :
Bucholtz, Frank ; Villarruel, Carl A ; Knapp, P.F. ; Shue, J. ; Andreadis, Tim D. ; Schermer, Ross T ; Gil Gil, Jesus ; Williams, Keith J.
Author_Institution :
Opt. Sci. Div., Naval Res. Lab., Washington, DC
Abstract :
The first measurement of the susceptibility of an off-the-shelf lithium-niobate intensity modulator to damage and disruption from high-power microwave pulses is reported. The device tested survived 1 kHz repetition rate pulses at 2.5 GHz centre frequency and 40 s width up to 200 W peak power. The results are discussed in terms of material parameters and device characteristics.
Keywords :
electro-optical modulation; electromagnetic pulse; lithium compounds; microwave photonics; optical materials; LiNbO3; electro-optic modulators; frequency 2.5 GHz; high-power microwave pulses; lithium-niobate modulator susceptibility; material parameters; radio-frequency photonic systems; time 40 mus;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20090009
