DocumentCode
1182114
Title
Fault diagnosis for linear systems via multifrequency measurements
Author
Sen, Neeraj ; Saeks, Richard
Volume
26
Issue
7
fYear
1979
fDate
7/1/1979 12:00:00 AM
Firstpage
457
Lastpage
465
Abstract
The fault diagnosis problem for a linear system whose transfer function matrix is measured at a discrete set of frequencies is formalized. A measure of solvability for the resultant equations and a measure of testability for the unit under test is developed. These, in turn, are used as the basis of algorithms for choosing test points and test frequencies.
Keywords
Analog integrated circuits; Deterministic; Fault diagnosis; Integrated circuit testing; Integrated circuits, analog; Analog circuits; Circuit faults; Circuit synthesis; Circuit testing; Computer networks; Electrical engineering; Fault diagnosis; Helium; Linear systems; Physics;
fLanguage
English
Journal_Title
Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0098-4094
Type
jour
DOI
10.1109/TCS.1979.1084659
Filename
1084659
Link To Document