• DocumentCode
    1182114
  • Title

    Fault diagnosis for linear systems via multifrequency measurements

  • Author

    Sen, Neeraj ; Saeks, Richard

  • Volume
    26
  • Issue
    7
  • fYear
    1979
  • fDate
    7/1/1979 12:00:00 AM
  • Firstpage
    457
  • Lastpage
    465
  • Abstract
    The fault diagnosis problem for a linear system whose transfer function matrix is measured at a discrete set of frequencies is formalized. A measure of solvability for the resultant equations and a measure of testability for the unit under test is developed. These, in turn, are used as the basis of algorithms for choosing test points and test frequencies.
  • Keywords
    Analog integrated circuits; Deterministic; Fault diagnosis; Integrated circuit testing; Integrated circuits, analog; Analog circuits; Circuit faults; Circuit synthesis; Circuit testing; Computer networks; Electrical engineering; Fault diagnosis; Helium; Linear systems; Physics;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1979.1084659
  • Filename
    1084659