• DocumentCode
    1182119
  • Title

    PIC simulation of effect of energy-dependent foil transparency in an axially-extracted vircator

  • Author

    Singh, Gursharn ; Chaturvedi, Shashank

  • Author_Institution
    Inst. for Plasma Res., Gujarat, India
  • Volume
    32
  • Issue
    6
  • fYear
    2004
  • Firstpage
    2210
  • Lastpage
    2216
  • Abstract
    We have performed two-dimensional, relativistic, electromagnetic, particle-in-cell simulations for an axially extracted vircator. With a copper foil anode, the output frequency of the vircator is found to be strongly dependent upon the variation of foil transparency with electron energy. Using an average transparency for all electron energies yields results that are markedly different from those obtained using the actual variation. However, the output power shows only mild sensitivity. Using the full energy-dependent form of the transparency, we get fairly good agreement with published experimental results. Increasing the energy resolution for the calculation of foil transparency increases the accuracy of calculation of the dominant frequency, although the frequency tends to saturate beyond a certain resolution. However, an increase in the resolution must necessarily be accompanied by an increase in the number of simulation particles, in order to limit statistical fluctuations to an acceptable level. A physical explanation has also been provided for these trends.
  • Keywords
    anodes; copper; fluctuations; foils; microwave generation; transparency; vircators; axially-extracted vircator; copper foil anode; electron energy; energy resolution; energy-dependent foil transparency; particle-in-cell simulations; statistical fluctuations; two-dimensional relativistic electromagnetic simulations; Accuracy; Anodes; Cathodes; Computational modeling; Copper; Electrons; Energy resolution; Fluctuations; Frequency; Power generation; Electron scattering; PIC; microwave; vircator;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2004.837610
  • Filename
    1366513