DocumentCode :
1182135
Title :
Calculation of parameter values from node voltage measurements
Author :
Trick, Timothy N. ; Mayeda, Wataru ; Sakla, Adel A.
Volume :
26
Issue :
7
fYear :
1979
fDate :
7/1/1979 12:00:00 AM
Firstpage :
466
Lastpage :
474
Abstract :
In this paper a theorem is given for the necessary and sufficient test conditions required to determine the value of a circuit component from node voltage measurements at a single test frequency. Several techniques are then presented for the calculation of circuit component values from voltage measurements, including a new technique based on the adjoint circuit concept. In addition, some results are presented on the measurement of component values using different test frequencies.
Keywords :
Analog integrated circuits; Deterministic; Integrated circuit testing; Integrated circuits, analog; Analog circuits; Automatic testing; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Current measurement; Dictionaries; Frequency; Voltage measurement;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1979.1084660
Filename :
1084660
Link To Document :
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