• DocumentCode
    1182135
  • Title

    Calculation of parameter values from node voltage measurements

  • Author

    Trick, Timothy N. ; Mayeda, Wataru ; Sakla, Adel A.

  • Volume
    26
  • Issue
    7
  • fYear
    1979
  • fDate
    7/1/1979 12:00:00 AM
  • Firstpage
    466
  • Lastpage
    474
  • Abstract
    In this paper a theorem is given for the necessary and sufficient test conditions required to determine the value of a circuit component from node voltage measurements at a single test frequency. Several techniques are then presented for the calculation of circuit component values from voltage measurements, including a new technique based on the adjoint circuit concept. In addition, some results are presented on the measurement of component values using different test frequencies.
  • Keywords
    Analog integrated circuits; Deterministic; Integrated circuit testing; Integrated circuits, analog; Analog circuits; Automatic testing; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Current measurement; Dictionaries; Frequency; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1979.1084660
  • Filename
    1084660
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1182135