Title :
Sequentially linear fault diagnosis: Part I-Theory
Author :
Liu, Ruey-Wen ; Visvanathan, V.
fDate :
7/1/1979 12:00:00 AM
Abstract :
A good solution to the tradeoff problem between the cost of the computation and the cost of test points is the sequentially linearly diagnosable systems. Conditions under which a system is sequentially linearly diagnosable are developed in Part I. A design procedure for the test points to fulfill these conditions is given in Part II.
Keywords :
Analog integrated circuits; Deterministic; Fault diagnosis; Integrated circuits, analog; Interconnected systems; Linear systems, time-invariant continuous-time; Aging; Circuit faults; Degradation; Fault diagnosis; Fuses; Large-scale systems; Stress; System performance; Temperature; Transfer functions;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1979.1084663
