Title :
Microwave breakdown in slots
Author :
Jordan, Ulf ; Anderson, Dan ; Backstrom, Mats ; Kim, Arkady V. ; Lisak, Mietek ; Lundén, Olof
Author_Institution :
Dept. of Electromagn., Chalmers Univ. of Technol., Goteborg, Sweden
Abstract :
The properties of microwave-induced breakdown of air in narrow metallic slots are investigated, both theoretically and experimentally, with emphasis on factors important for protection against transmission of incident high-power microwave radiation. The key factors investigated are breakdown power threshold, breakdown time, peak-leakage power, and total transmitted energy, as functions of incident pulse shape and power density. The theoretical investigation includes estimates of the electric field intensification in narrow slots and basic breakdown plasma modeling. New results important for application to the high-power microwave field, such as the influence of pulse shape on breakdown time and peak-leakage power, are presented. The experimental investigation comprises a set of slot breakdown experiments at atmospheric pressure, which are analyzed to extract key parameters, such as transmission cross section, breakdown time, peak leakage power, and transmitted energy. The experimental data is compared and shown to be in good agreement with results obtained in the theoretical investigation.
Keywords :
high-frequency discharges; microwave generation; microwave power transmission; slot lines; breakdown plasma modeling; breakdown power threshold; breakdown time; electric field intensification; incident high-power microwave radiation; incident pulse shape; microwave breakdown; narrow metallic slots; peak-leakage power; power density; total transmitted energy; transmission cross section; transmission protection; Atmospheric modeling; Atmospheric-pressure plasmas; Data mining; Electric breakdown; Estimation theory; Plasma applications; Plasma density; Protection; Pulse shaping methods; Shape; Breakdown plasmas; high-power microwave (HPM) protection; microwave breakdown; slots;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2004.838594