DocumentCode :
118223
Title :
Multilayer chip embedded based on the organic substrate
Author :
Xueping Guo ; Zhongyao Yu ; Liqiang Cao ; Yang Song ; Yu Sun ; Zhidan Fang ; Hu Hao ; Guowei Ding
Author_Institution :
Nat. Center for Adv. Packaging (NCAP China), Wuxi, China
fYear :
2014
fDate :
12-15 Aug. 2014
Firstpage :
66
Lastpage :
69
Abstract :
This paper mainly does research about the multilayer chip embedded based on the organic substrates. On the one hand, that puts forward a new 3D package structure of the organic substrates embedded. On the other hand, we find a kind of process flow based the whole organic substrate process and solve the key process. We completed the sample and test of the single-layer chip based the multilayer chip embedded structure. The structure realizes the high integration density 3D package based the chip embedded. That has some advantage of the package size, the electrical performance, the cost and the thermal management performance, etc. That can shorten the distance between the chip interconnection to improve the transmission performance. That can have the electromagnetic shielding effect and improves the EMC performance in the embedded system. In the process, we have done the package sample using the embedded substrate through the process and using the mature and low-cost organic substrate and micro package process and verify multilayer chip embedded process feasibility. The sample has passed tentative E-test and reliability test of reflow.
Keywords :
electromagnetic compatibility; electromagnetic shielding; embedded systems; integrated circuit interconnections; integrated circuit packaging; integrated circuit testing; multilayers; substrates; thermal management (packaging); three-dimensional integrated circuits; EMC performance; chip interconnection; electrical performance; electromagnetic shielding effect; embedded substrate; embedded system; high integration density 3D package structure; micropackage process; multilayer chip embedded structure; organic substrate process; passed tentative E-test; process flow; reliability test; single-layer chip; thermal management performance; transmission performance; Assembly; Nonhomogeneous media; Packaging; Reliability; Substrates; Three-dimensional displays; Performance; embedded; multilayer chip; process;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
Type :
conf
DOI :
10.1109/ICEPT.2014.6922590
Filename :
6922590
Link To Document :
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