Title :
On the use of procedural models for generation of test programs
Author :
Chien, Robert T. ; Fletcher, Roderick J. ; Ho, William P C ; Peterson, Larry J.
fDate :
7/1/1979 12:00:00 AM
Abstract :
An approach based on artificial intelligence concepts is developed for automatic generation of test programs for analog circuits. The programs will, with the help of automatic test equipment (ATE), make appropriate measurements and deduce the location of potential faults in analog circuit boards.
Keywords :
Analog integrated circuits; Artificial intelligence; Automatic test software; Computer software design/development; Fault diagnosis; Integrated circuits, analog; Software-simulations; Artificial intelligence; Automatic test equipment; Automatic testing; Circuit analysis; Circuit faults; Circuit testing; Dictionaries; Printed circuits; System testing; Voltage;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1979.1084672
