DocumentCode :
1182261
Title :
Sequentially linear fault diagnosis: Part II-The design of diagnosable systems
Author :
Visvanathan, V. ; Liu, Ruey-Wen
Volume :
26
Issue :
7
fYear :
1979
fDate :
7/1/1979 12:00:00 AM
Firstpage :
558
Lastpage :
564
Abstract :
Based on the results developed in Part I a strategy of test point location by which the parameters of an LSDS are made diagnosable in a generic sense, is developed. By appropriate test point placement, an LSDS is reduced to a canonical LSDS. Next, an algorithm for the synthesis of the test points required to make the parameters of the canonical LSDS sequentially linearly diagnosable in a generic sense, is given.
Keywords :
Analog integrated circuits; Fault diagnosis; Integrated circuits, analog; Interconnected systems; Linear systems, time-invariant continuous-time; Special designs; Circuit synthesis; Circuit testing; Detectors; Fault diagnosis; Seminars; Sequential analysis; Sequential diagnosis; Signal generators; Sufficient conditions; System testing;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1979.1084673
Filename :
1084673
Link To Document :
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