DocumentCode
1182319
Title
Simple technique for measuring cavity loss in semiconductor lasers
Author
Ketelsen, L.J.P.
Author_Institution
AT&T Bell Labs., Murray Hill, NJ
Volume
30
Issue
17
fYear
1994
fDate
8/18/1994 12:00:00 AM
Firstpage
1422
Lastpage
1424
Abstract
A new technique for measuring the cavity loss of semiconductor lasers is introduced. The cavity loss is deduced from the Fabry-Perot oscillations in the spontaneous emission well below the bandgap of the active region. This approach, referred to as the below-bandgap technique, is simple, applicable to both Fabry-Perot and DFB lasers, and is capable of measuring cavity losses with few restrictions on laser bias current
Keywords
distributed feedback lasers; laser cavity resonators; laser variables measurement; optical loss measurement; semiconductor lasers; DFB lasers; Fabry-Perot lasers; Fabry-Perot oscillations; below-bandgap technique; cavity loss measurement; laser bias current; semiconductor lasers; spontaneous emission;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19940930
Filename
326305
Link To Document