Title :
Embedded loopback test for RF ICs
Author :
Yoon, Jang-Sup ; Eisenstadt, William R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
Abstract :
This paper explores the use of on-chip or on-wafer loopback implementations for verifying performance of 5-GHz wireless local area network (WLAN) IC circuits. The loopback test diagram, the test-circuit design, and the characterization data are reported for subcircuits (attenuators, and switches) necessary to implement 5-GHz transceiver loopback. A loopback circuit that can be applied to transceiver loopback measurements is demonstrated. This research is exploratory in nature and is a first attempt at a new on-chip RF test technique.
Keywords :
embedded systems; integrated circuit testing; radiofrequency integrated circuits; transceivers; wireless LAN; 5 GHz; RF IC; WLAN IC; attenuator; loopback circuit; loopback test diagram; on-chip RF test; on-chip loopback implementation; on-wafer loopback implementation; switch; test-circuit design; transceiver loopback; wireless local area network IC; Automatic testing; Circuit testing; Network-on-a-chip; RF signals; Radio frequency; Switches; System testing; Transceivers; Transmitters; Wireless LAN; Loopback; measurements; on-chip; radio frequancy (RF); test; transceiver; wireless local area network (WLAN);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.855091
