Title :
Interfacial microstructure and withstand voltage of polyethylene for power cables
Author :
Gao, L.Y. ; Guo, W.Y. ; Tu, D.M.
Author_Institution :
Dept. of Electr. Eng., Tongji Univ., Shanghai, China
fDate :
4/1/2003 12:00:00 AM
Abstract :
In order to increase the electrical breakdown strength and treeing inception voltage of cross-linked polyethylene (XLPE) insulated power cable, surfactant in combination with titanate coupling agent, as an additive, has been mixed with the semiconducting layer, which is surrounded by polyethylene insulation, to chemically improve the dielectric properties of polyethylene interface. By means of infrared and X-ray diffraction spectra analyses, a change in the crystalline orientation angle and the density of polyethylene is observed inside the improved polyethylene interfacial layer. Additionally, it is assumed that a thin diffusion layer is formed, that results in a decrease in the electric field stress on the polyethylene interface and then an increase in the withstand voltage of polyethylene.
Keywords :
X-ray diffraction; XLPE insulation; crystal microstructure; dielectric properties; infrared spectra; insulation testing; power cable insulation; power cable testing; X-ray diffraction spectra analysis; XLPE insulated power cable; additive; cross-linked polyethylene; crystalline orientation angle; dielectric properties; infrared analysis; interfacial microstructure; polyethylene; polyethylene density; polyethylene interface; polyethylene interfacial layer; power cables; semiconducting layer; surfactant; thin diffusion layer; titanate coupling agent; withstand voltage; Breakdown voltage; Cable insulation; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Microstructure; Polyethylene; Power cables; Semiconductor device breakdown; Trees - insulation;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2003.1194104